no SMART rve jak o zivot - mam z smartd udelany mail info :
The following warning/error was logged by the smartd daemon:
Device: /dev/hda, ATA error count increased from 52 to 54
For details see host's SYSLOG (default: /var/log/messages).
jinak uz jsem na tom routeru provozoval vic disku a i MB - bohuzel si nepamatuju vsechny modely - vetsi problemy mam az s timhleKód:smartctl -a /dev/hda smartctl version 5.36 [i486-slackware-linux-gnu] Copyright (C) 2002-6 Bruce Allen Home page is http://smartmontools.sourceforge.net/ === START OF INFORMATION SECTION === Model Family: Seagate U4 family Device Model: ST34311A Serial Number: 5BF2A168 Firmware Version: 8.01 User Capacity: 4 327 464 960 bytes Device is: In smartctl database [for details use: -P show] ATA Version is: 4 ATA Standard is: Exact ATA specification draft version not indicated Local Time is: Wed Aug 2 22:34:17 2006 CEST SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x82) Offline data collection activity was completed without error. Auto Offline Data Collection: Enabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: (3120) seconds. Offline data collection capabilities: (0x1b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. No Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. No General Purpose Logging support. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 10) minutes. SMART Attributes Data Structure revision number: 10 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x0008 111 099 000 Old_age Offline - 33216423 3 Spin_Up_Time 0x0006 097 097 000 Old_age Always - 0 4 Start_Stop_Count 0x0013 100 100 020 Pre-fail Always - 90 5 Reallocated_Sector_Ct 0x0013 100 100 036 Pre-fail Always - 0 7 Seek_Error_Rate 0x0009 075 060 030 Pre-fail Offline - 4335450923 10 Spin_Retry_Count 0x0013 100 100 090 Pre-fail Always - 0 12 Power_Cycle_Count 0x0013 099 099 020 Pre-fail Always - 1368 197 Current_Pending_Sector 0x0010 100 100 000 Old_age Offline - 0 198 Offline_Uncorrectable 0x0010 100 100 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 0 SMART Error Log Version: 1 ATA Error Count: 54 (device log contains only the most recent five errors) CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 54 occurred at disk power-on lifetime: 9572 hours (398 days + 20 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 01 51 28 5f 0f 0c e0 Error: Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- Error 53 occurred at disk power-on lifetime: 9572 hours (398 days + 20 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 01 51 30 00 45 3c e0 Error: Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- Error 52 occurred at disk power-on lifetime: 9572 hours (398 days + 20 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 01 51 80 00 c1 00 e0 Error: Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- Error 51 occurred at disk power-on lifetime: 9572 hours (398 days + 20 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 01 51 80 80 86 00 e0 Error: Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- Error 50 occurred at disk power-on lifetime: 9572 hours (398 days + 20 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 01 51 80 00 8b 00 e0 Error: Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] Device does not support Selective Self Tests/Logging
Kernel 2.4.29, MB string 05/27/98-Ali-154x-2a5kib09c-00